| # | A | B | C | D | E | F |
| G | H | I | J | K | L | M |
| N | O | P | Q | R | S | T |
| U | V | W | X | Y | Z | |
Begriffe | |||||||||||
| Macro Process Mapping (macro process mapping) | |||||||||||
| Managementprozesse (management processes) | |||||||||||
| Managementsystem (management system) | |||||||||||
| Mangel (defect) | |||||||||||
| Maschinenfähigkeitsindex – kritischer (Cmk) (critical machine capability index) | |||||||||||
| Maschinenfähigkeitsindex – potenzieller (Cm) (potential machine capability index) | |||||||||||
| Massenfertigung (mass production) | |||||||||||
| Master Black Belt | |||||||||||
| Mean Time Between Failure (MTBF) | |||||||||||
| Mean Time To Repair (MTTR) | |||||||||||
| Median (median) | |||||||||||
| Merkmale mit besonderer Bedeutung (special characteristics) | |||||||||||
| Messabweichung (measurement error) | |||||||||||
| Messabweichung – systematische (systematic error) | |||||||||||
| Messgenauigkeit (accuracy of measurement) | |||||||||||
| Messgerät (measuring instrument) | |||||||||||
| Messmittelfähigkeitsindex – kritischer (Cgk) (gage capability index, critical (Cgk)) | |||||||||||
| Messmittelfähigkeitsindex – potenzieller (Cg) (gage capability index, potential (Cg)) | |||||||||||
| Messsystem (measurement system) | |||||||||||
| Messung (measurement) | |||||||||||
| Messunsicherheit (measurement uncertainty) | |||||||||||
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| Messverfahren (measurement procedure, standard operating procedure) | |||||||||||
| Methoden-KVP | |||||||||||
| Micro Process Mapping (micro process mapping) | |||||||||||
| Mitarbeiter-KVP | |||||||||||
| Mittelwert (mean) | |||||||||||
| Muda | |||||||||||
| Mura | |||||||||||
| Muri |